• DocumentCode
    2660219
  • Title

    Enhancement of hole mobility due to confinement in small diameter [110] silicon nanowires

  • Author

    Buin, A.K. ; Verma, A. ; Anantram, M.P.

  • Author_Institution
    Waterloo Univ., Waterloo
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We present results on a detailed computation of electron and hole low-field mobility for [110] axially oriented free standing SiNWs with diameters up to 3.1 nm and at various temperatures, where the principal charge scattering mechanism is through acoustic phonons, and both confined and bulk phonons are considered. The band structure for these SiNWs is determined by using a sp3d5s* TB scheme and the confined acoustic phonon dispersion for each SiNW is obtained by solving the elastic continuum wave equation. Bulk phonon dispersion is considered to be linear and a Debye cut-off energy is used to define the domain of bulk phonon wavevectors. Electron and hole - acoustic phonon scattering rates are calculated from the first order perturbation theory and deformation potential scattering, where TB electron and hole wavefunctions are incorporated. Finally, low-field mobility values are determined through momentum relaxation time approximation, and confirmed for electron-confined phonon interaction through ensemble Monte Carlo simulations.
  • Keywords
    carrier relaxation time; electron mobility; electron-phonon interactions; elemental semiconductors; hole mobility; nanowires; perturbation theory; phonon dispersion relations; silicon; Debye cut-off energy; Si; [110] silicon nanowires; band structure; bulk phonon dispersion; bulk phonon wavevectors; charge scattering mechanism; confined acoustic phonon dispersion; deformation potential scattering; elastic continuum wave equation; electron low-field mobility; electron-confined phonon interaction; ensemble Monte Carlo simulations; first order perturbation theory; hole low-field mobility; hole mobility enhancement; momentum relaxation time approximation; sp3d5s* TB scheme; Acoustic scattering; Carrier confinement; Charge carrier processes; Effective mass; Electron mobility; Nanowires; Phonons; Scattering parameters; Silicon; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1891-6
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422449
  • Filename
    4422449