• DocumentCode
    2660260
  • Title

    Study of ice accumulation on nanocomposite semiconducting coatings

  • Author

    Momen, G. ; Farzaneh, M.

  • Author_Institution
    Univ. du Quebec a Chicoutimi, Chicoutimi, QC, Canada
  • fYear
    2010
  • fDate
    17-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Nanocomposite materials are attracting the attention of many researchers in the field of dielectric and electrical insulation. In this paper, we produced a dielectric coating on a glass surface by incorporating ZnO nanoparticles into RTV silicone rubber. Different concentrations of nanofiller (up to 40 % ZnO) were investigated. Physicochemical characterization of these coatings was performed using SEM and water contact angle (WCA). The influence of the nanofiller concentration in a specific frequency range (40 Hz to 2 MHz) on the dielectric behavior of the nanocomposites was analyzed as well. The results showed that the dielectric constant of nanocomposites increases with the ZnO weight content. Then, ice was accreted on the surfaces to evaluate the minimum energy required to prevent ice accumulation based on the Joule heating effect. The results are discussed and emphasis is placed on the semiconducting properties influencing ice accumulation.
  • Keywords
    II-VI semiconductors; accumulation layers; heating; ice; insulating coatings; nanocomposites; nanoparticles; permittivity; scanning electron microscopy; silicon; silicone rubber; wide band gap semiconductors; zinc compounds; Joule heating effect; RTV silicone rubber; SEM; Si; ZnO; dielectric coating; dielectric constant; dielectric field insulation; electrical field insulation; frequency 40 Hz to 2 MHz; ice accumulation; nanocomposite material; nanocomposite semiconducting coating; nanofiller concentration; nanoparticle; physicochemical characterization; water contact angle; Coatings; Dielectrics; Ice; Nanoparticles; Rubber; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
  • Conference_Location
    West Lafayette, IN
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-9468-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2010.5724058
  • Filename
    5724058