DocumentCode
2660260
Title
Study of ice accumulation on nanocomposite semiconducting coatings
Author
Momen, G. ; Farzaneh, M.
Author_Institution
Univ. du Quebec a Chicoutimi, Chicoutimi, QC, Canada
fYear
2010
fDate
17-20 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
Nanocomposite materials are attracting the attention of many researchers in the field of dielectric and electrical insulation. In this paper, we produced a dielectric coating on a glass surface by incorporating ZnO nanoparticles into RTV silicone rubber. Different concentrations of nanofiller (up to 40 % ZnO) were investigated. Physicochemical characterization of these coatings was performed using SEM and water contact angle (WCA). The influence of the nanofiller concentration in a specific frequency range (40 Hz to 2 MHz) on the dielectric behavior of the nanocomposites was analyzed as well. The results showed that the dielectric constant of nanocomposites increases with the ZnO weight content. Then, ice was accreted on the surfaces to evaluate the minimum energy required to prevent ice accumulation based on the Joule heating effect. The results are discussed and emphasis is placed on the semiconducting properties influencing ice accumulation.
Keywords
II-VI semiconductors; accumulation layers; heating; ice; insulating coatings; nanocomposites; nanoparticles; permittivity; scanning electron microscopy; silicon; silicone rubber; wide band gap semiconductors; zinc compounds; Joule heating effect; RTV silicone rubber; SEM; Si; ZnO; dielectric coating; dielectric constant; dielectric field insulation; electrical field insulation; frequency 40 Hz to 2 MHz; ice accumulation; nanocomposite material; nanocomposite semiconducting coating; nanofiller concentration; nanoparticle; physicochemical characterization; water contact angle; Coatings; Dielectrics; Ice; Nanoparticles; Rubber; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
Conference_Location
West Lafayette, IN
ISSN
0084-9162
Print_ISBN
978-1-4244-9468-2
Type
conf
DOI
10.1109/CEIDP.2010.5724058
Filename
5724058
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