DocumentCode :
2660428
Title :
Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites
Author :
Sami, A. ; David, E. ; Fréchette, M.
Author_Institution :
Ecole de Technol. Super. (ETS), Montreal, QC, Canada
fYear :
2010
fDate :
17-20 Oct. 2010
Firstpage :
1
Lastpage :
4
Abstract :
The separation of amorphous and crystalline contributions in diffraction data is a necessary step in the study of the structure of the less-ordered regions and in the calculation of the crystallinity of a HDPE and LDPE/SiO2 nanocomposites. The nanocomposites have been prepared by melt compounding using a twin screw extruder. We suggest here that the diffraction pattern of a nanocomposite with a high degree of crystalline order may be fitted with easily resolvable crystalline peaks, and that the intensity not attributable to the crystalline peaks may be regarded as the amorphous scattering. This amorphous halo can be used as a template in analysing the diffraction patterns of crystalline samples.
Keywords :
X-ray diffraction; crystallisation; melt processing; nanocomposites; nanofabrication; silicon compounds; SiO2; X-ray diffraction; amorphous scattering; amorphous-crystalline structures; crystallisation; high density composites; low density composites; melt compounding; nanocomposites; twin screw extruder; Diffraction; Nanocomposites; Nanoparticles; Polymers; Scattering; X-ray diffraction; X-ray scattering; HDPE / LDPE; SiO2; X-ray diffraction; crystallinity; nanocomposites materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
Conference_Location :
West Lafayette, IN
ISSN :
0084-9162
Print_ISBN :
978-1-4244-9468-2
Type :
conf
DOI :
10.1109/CEIDP.2010.5724069
Filename :
5724069
Link To Document :
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