Title :
The Effect Of A Re-read On Data Reliability
Author :
Patapoutian, A. ; Vea, M.P.
Author_Institution :
Quantum Corporation
Keywords :
Density functional theory; Detectors; Disk drives; Error correction; Error correction codes; Event detection; Gaussian noise; Genetic expression;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597751
