• DocumentCode
    2660548
  • Title

    Dependence of electrical treeing behavior on cross-linking temperature of XLPE

  • Author

    Du, B.X. ; Han, T. ; Gao, Y. ; Ma, Z.L. ; Zhu, X.H.

  • Author_Institution
    Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China
  • fYear
    2010
  • fDate
    17-20 Oct. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, XLPE laminate was employed as test sample to investigate the effect of cross-linking temperature on characteristics of electrical treeing. The samples were cross-linked at the temperature ranged from 150°C to 220°C by adding dicumyl peroxide (DCP) as cross-linking agent into low density polyethylene (LDPE). A pair of needle-plate electrodes was employed to initiate the tree by applying ac voltage between the electrodes. The experiment was carried out at 30°C, 60°C and 90°C, respectively. A digital microscope was employed to observe the growth process of electrical trees. The profile of crystal grains were captured by using a polarizing microscope. Obtained results show the dependence of characteristics of both tree initiation and propagation upon cross-linking temperature of XLPE. It is suggested that the treeing behavior is influenced by both crystallinity and crystal grain morphology which are varied as a function of the cross-linking temperature.
  • Keywords
    XLPE insulation; crystal structure; trees (electrical); XLPE laminate; ac voltage; cross-linking agent; cross-linking temperature; crystal grain morphology; crystal grains; crystallinity; dicumyl peroxide; digital microscope; electrical treeing behavior; electrical trees; growth process; low density polyethylene; needle-plate electrodes; tree initiation; Crystals; Electrodes; Insulation; Joining processes; Morphology; Temperature distribution; XLPE; cross-linking temperature; crystal morphology; electrical tree;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
  • Conference_Location
    West Lafayette, IN
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4244-9468-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2010.5724076
  • Filename
    5724076