• DocumentCode
    2660600
  • Title

    Ballisticity of the linear response transport in nanometric silicon devices

  • Author

    Jungemann, Christoph

  • Author_Institution
    EIT4, Bundeswehr University, Germany
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In modern devices the electron current flows through space charge regions, which are about 20 nm thick. Such thin space charge regions can be obtained only by very high doping concentrations, which lead to strong built-in fields. Similarly, an applied bias leads to a strong electric field in the space charge region and the transport in this is known to be quasi ballistic. Based on a deterministic solver for the Boltzmann equation the linear response of the distribution function has been calculated. It is found that the linear response contains a ballistic part, which is due to the strong built-in fields in nanometric devices.
  • Keywords
    Boltzmann equation; ballistic transport; electron mobility; nanoelectronics; semiconductor device models; semiconductor doping; silicon; space charge; Si; ballisticity; electron current flow; high doping concentration; linear response transport; nanometric silicon devices; quasi ballistic region; space charge region; strong electric fields; Ballistic transport; Boltzmann equation; Conductivity; Distribution functions; Educational institutions; Electrons; Nanoscale devices; Shape; Silicon devices; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1892-3
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422475
  • Filename
    4422475