DocumentCode
2660600
Title
Ballisticity of the linear response transport in nanometric silicon devices
Author
Jungemann, Christoph
Author_Institution
EIT4, Bundeswehr University, Germany
fYear
2007
fDate
12-14 Dec. 2007
Firstpage
1
Lastpage
2
Abstract
In modern devices the electron current flows through space charge regions, which are about 20 nm thick. Such thin space charge regions can be obtained only by very high doping concentrations, which lead to strong built-in fields. Similarly, an applied bias leads to a strong electric field in the space charge region and the transport in this is known to be quasi ballistic. Based on a deterministic solver for the Boltzmann equation the linear response of the distribution function has been calculated. It is found that the linear response contains a ballistic part, which is due to the strong built-in fields in nanometric devices.
Keywords
Boltzmann equation; ballistic transport; electron mobility; nanoelectronics; semiconductor device models; semiconductor doping; silicon; space charge; Si; ballisticity; electron current flow; high doping concentration; linear response transport; nanometric silicon devices; quasi ballistic region; space charge region; strong electric fields; Ballistic transport; Boltzmann equation; Conductivity; Distribution functions; Educational institutions; Electrons; Nanoscale devices; Shape; Silicon devices; Space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Device Research Symposium, 2007 International
Conference_Location
College Park, MD
Print_ISBN
978-1-4244-1892-3
Electronic_ISBN
978-1-4244-1892-3
Type
conf
DOI
10.1109/ISDRS.2007.4422475
Filename
4422475
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