• DocumentCode
    2661403
  • Title

    Design of a GaAs operational amplifier using a self-backgating MESFET model including deep-level trap effects

  • Author

    Lee, Mankoo ; Forbes, Leonard ; Hallen, Thor

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
  • fYear
    1990
  • fDate
    1-3 May 1990
  • Firstpage
    2287
  • Abstract
    A GaAs op amp has been designed using a self-backgating MESFET model which can simulate low-frequency anomalies and also has been fabricated by a 0.5-μm conventional MESFET technology. This model has been incorporated into PSPICE and includes an analytical DC and capacitance model with an RC network providing device symmetry. The op amp has three inverting stages, series-shunt feedback, and internal compensation with forward blocking to achieve unique stability. Measured data corresponds to simulations by the model. The authors have obtained a 35-dB open-loop gain in the high-frequency regime, 4-GHz gain-bandwidth product, an output voltage-swing range of -3.7 V to 3.4 V, and a total power dissipation of 0.46 W. The low-frequency anomalies of the GaAs amplifier are more accurately predicted using this model than with any other previous model
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; circuit CAD; deep levels; electron traps; equivalent circuits; feedback; gallium arsenide; hole traps; linear integrated circuits; operational amplifiers; semiconductor device models; -3.7 to 3.4 V; 0.46 W; 0.5 micron; 35 dB; DC model; GaAs; PSPICE; RC network; capacitance model; deep-level trap effects; device symmetry; forward blocking; internal compensation; inverting stages; op amp; operational amplifier; self-backgating MESFET model; series-shunt feedback; stability; Capacitance; Feedback; Gallium arsenide; MESFETs; Operational amplifiers; Power dissipation; Predictive models; SPICE; Stability; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1990., IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Type

    conf

  • DOI
    10.1109/ISCAS.1990.112465
  • Filename
    112465