• DocumentCode
    2662490
  • Title

    The Promise of Known-good-die Technologies

  • Author

    Vasquez, Barbara ; Lindsey, Scott

  • Author_Institution
    MOTOROLA, AZ
  • fYear
    1994
  • fDate
    13-15 Apr 1994
  • Firstpage
    1
  • Lastpage
    6
  • Keywords
    Application specific integrated circuits; Automatic testing; CMOS technology; Circuit testing; Contacts; Fixtures; Integrated circuit testing; Manufacturing industries; Semiconductor device manufacture; Semiconductor device packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1994. Proceedings of the 1994 International Conference on
  • Print_ISBN
    0-930815-39-4
  • Type

    conf

  • DOI
    10.1109/ICMCM.1994.753521
  • Filename
    753521
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2662490