DocumentCode
2662562
Title
Development of a Burn-in and Test Process for Producing Known-Good-Die
Author
Prokopchak, Lina ; Wrenn, James M.
Author_Institution
Aehr Test Systems, CA
fYear
1994
fDate
13-15 Apr 1994
Firstpage
23
Lastpage
28
Keywords
Automatic testing; Conductive films; Contacts; Costs; Integrated circuit testing; Packaging machines; Semiconductor device manufacture; Sockets; Substrates; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Multichip Modules, 1994. Proceedings of the 1994 International Conference on
Print_ISBN
0-930815-39-4
Type
conf
DOI
10.1109/ICMCM.1994.753524
Filename
753524
Link To Document