• DocumentCode
    2662948
  • Title

    Algorithmic Diagnosis of Multichip Module Defects Using the IEEE 1149.1 Standard

  • Author

    Posse, Ken

  • Author_Institution
    Hewlett Packard, Colorado
  • fYear
    1994
  • fDate
    13-15 Apr 1994
  • Firstpage
    199
  • Lastpage
    204
  • Keywords
    Circuit faults; Circuit testing; Costs; Failure analysis; Fault diagnosis; Integrated circuit interconnections; Manufacturing; Multichip modules; Pins; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1994. Proceedings of the 1994 International Conference on
  • Print_ISBN
    0-930815-39-4
  • Type

    conf

  • DOI
    10.1109/ICMCM.1994.753551
  • Filename
    753551
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2662948