DocumentCode

2662958

Title

Applications of Latent Open Test

Author

Economikos, Laertis ; Chiang, Shinwu ; Halperin, Arnold

Author_Institution

IBM Microelectronics, NY

fYear

1994

fDate

13-15 Apr 1994

Firstpage

205

Lastpage

210

Keywords

Conductors; Detectors; Frequency; Manufacturing processes; Multichip modules; Nonlinear distortion; Phase detection; Phase distortion; Strips; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Multichip Modules, 1994. Proceedings of the 1994 International Conference on

Print_ISBN

0-930815-39-4

Type

conf

DOI

10.1109/ICMCM.1994.753552

Filename

753552