• DocumentCode
    2662966
  • Title

    Testing Multichip Modules and Bare Die Using Vision Probing Techniques

  • Author

    Place, Denis

  • Author_Institution
    KARL SUSS AMERICA, VT
  • fYear
    1994
  • fDate
    13-15 Apr 1994
  • Firstpage
    211
  • Lastpage
    216
  • Keywords
    Automatic testing; Circuit testing; Costs; Machine vision; Multichip modules; Optical sensors; Performance evaluation; Probes; Semiconductor device manufacture; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1994. Proceedings of the 1994 International Conference on
  • Print_ISBN
    0-930815-39-4
  • Type

    conf

  • DOI
    10.1109/ICMCM.1994.753553
  • Filename
    753553
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2662966