• DocumentCode
    2662994
  • Title

    Boundary Scan Techniques in an Mcm-D Application

  • Author

    Hilla, Stephen C.

  • Author_Institution
    Environmental Research Institute of Michigan
  • fYear
    1994
  • fDate
    13-15 Apr 1994
  • Firstpage
    217
  • Lastpage
    222
  • Keywords
    Circuit testing; Electronic equipment testing; Image processing; Integrated circuit interconnections; Multichip modules; Performance evaluation; Printed circuits; Programmable logic arrays; Silicon; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multichip Modules, 1994. Proceedings of the 1994 International Conference on
  • Print_ISBN
    0-930815-39-4
  • Type

    conf

  • DOI
    10.1109/ICMCM.1994.753554
  • Filename
    753554