Title :
A study of faulty signature for diagnostics
Author :
Chan, John C. ; Womack, Baxter F.
Author_Institution :
IBM Corp., Austin, TX, USA
Abstract :
A study of faulty signatures in computer hardware testing is presented. A faulty signature is caused by one of many possible input sequences that contains errors at different locations. The faulty signature is analyzed, and it is found that the number of errors among the sequences are distributed with binomial characteristics. Based on this information, a scheme for identifying the failing tests is proposed. A fault-isolation process is discussed
Keywords :
computer equipment testing; fault location; logic testing; printed circuit testing; binomial characteristics; computer hardware testing; fault analysis; fault-isolation process; faulty signature for diagnostics; number of errors; signature analysis; study of faulty signatures; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Failure analysis; Fault diagnosis; Hardware; Linear feedback shift registers; Polynomials; Vectors;
Conference_Titel :
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location :
New Orleans, LA
DOI :
10.1109/ISCAS.1990.112566
