DocumentCode
2663103
Title
A study of faulty signature for diagnostics
Author
Chan, John C. ; Womack, Baxter F.
Author_Institution
IBM Corp., Austin, TX, USA
fYear
1990
fDate
1-3 May 1990
Firstpage
2701
Abstract
A study of faulty signatures in computer hardware testing is presented. A faulty signature is caused by one of many possible input sequences that contains errors at different locations. The faulty signature is analyzed, and it is found that the number of errors among the sequences are distributed with binomial characteristics. Based on this information, a scheme for identifying the failing tests is proposed. A fault-isolation process is discussed
Keywords
computer equipment testing; fault location; logic testing; printed circuit testing; binomial characteristics; computer hardware testing; fault analysis; fault-isolation process; faulty signature for diagnostics; number of errors; signature analysis; study of faulty signatures; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Failure analysis; Fault diagnosis; Hardware; Linear feedback shift registers; Polynomials; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location
New Orleans, LA
Type
conf
DOI
10.1109/ISCAS.1990.112566
Filename
112566
Link To Document