Bridging the gap between design and testing of analog integrated circuits

Author

Soenen, E. ; VanPeteghem, P. ; Liu, H. ; Narayan, S. ; Cummings, J.

Author_Institution

Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA

fYear

1990

fDate

1-3 May 1990

Firstpage

2716

Abstract

A global methodology for the design of analog and mixed analog/digital integrated systems is outlined. The methodology calls for a flexible framework that combines CAD software, simulators, measurement set-ups, and data-processing software. As an application example within such a framework, error modeling and estimation in multistage analog/digital converters is discussed using a new algorithm

Keywords

analogue-digital conversion; application specific integrated circuits; circuit CAD; integrated circuit testing; linear integrated circuits; CAD software; analog IC design; analog IC testing; application example; bridging gap between design and test; data-processing software; error modeling and estimation; fault analysis; flexible framework; global methodology; measurement set-ups; mixed analog/digital integrated systems; mixed mode IC design; multistage analog/digital converters; simulators; Analog integrated circuits; Analog-digital conversion; Circuit simulation; Circuit testing; Data processing; Driver circuits; Instruments; Integrated circuit testing; Iterative algorithms; Signal processing algorithms;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1990., IEEE International Symposium on

Conference_Location

New Orleans, LA

Type

conf

DOI

10.1109/ISCAS.1990.112570

Filename

112570