Easily testable DCVS multiplier

Author

Takach, Andres R. ; Jha, Niraj K.

Author_Institution

Dept. of Electr. Eng., Princeton Univ., NJ, USA

fYear

1990

fDate

1-3 May 1990

Firstpage

2732

Abstract

Clocked differential cascode voltage switch (DCVS) circuits are dynamic CMOS circuits which have the advantage of being protected against test-set invalidation due to circuit delays. A C-testable DCVS design of a carry-save parallel multiplier is presented. This design is C-testable with only six test vectors which detect all detectable stuck-at, stuck-on, and stuck-open faults in the circuit. The hardware needed for an n×n multiplier consists of n (n-1) full-adders, a summand generator consisting of n ² 2-input AND gates, as well as (at most) four extra 2-input AND gates to enhance the controllability of the circuit. An additional controllable input t is required. The design of the multiplier is discussed. The set of vectors to test the individual building blocks of the multiplier is presented. The input assignments to the DCVS multiplier, which result in the application of the appropriate tests to each module, are discussed, and the validity of the test set for detecting the detectable single stuck-at, stuck-open, and stuck-on faults is proved

Keywords

CMOS integrated circuits; VLSI; digital arithmetic; integrated circuit testing; logic arrays; multiplying circuits; 2-input AND gates; C-testable DCVS design; carry-save parallel multiplier; circuit delays; clocked DCVS circuits; controllability; controllable input; design; design for testability; differential cascode voltage switch; dynamic CMOS circuits; fault analysis; full-adders; input assignments; n×n multiplier; protected against test-set invalidation; set of vectors; six test vectors; stuck-at faults; stuck-on faults; stuck-open faults; summand generator; test set; testable DCVS multiplier; Circuit faults; Circuit testing; Clocks; Delay; Electrical fault detection; Fault detection; Protection; Switches; Switching circuits; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1990., IEEE International Symposium on

Conference_Location

New Orleans, LA

Type

conf

DOI

10.1109/ISCAS.1990.112574

Filename

112574