• DocumentCode
    2663394
  • Title

    DSC-a space compression method

  • Author

    Jone, Wen-Ben

  • Author_Institution
    Dept. of Comput. Sci., New Mexico Inst. of Min. & Technol., Socorro, NM, USA
  • fYear
    1990
  • fDate
    1-3 May 1990
  • Firstpage
    2756
  • Abstract
    A dynamic space-compression method called DSC is proposed. The basic idea of DSC is to construct the compression circuits by dynamically estimating error probabilities of the outputs. Experimental results demonstrate that DSC is very efficient. The theory to predict the performance of general space compression methods is developed and is verified by computer simulation results
  • Keywords
    built-in self test; digital integrated circuits; integrated circuit testing; logic testing; BIST; DSC; computer simulation results; dynamic space-compression method; dynamically estimating error probabilities; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Computer science; Electrical fault detection; Error probability; Fault detection; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1990., IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Type

    conf

  • DOI
    10.1109/ISCAS.1990.112580
  • Filename
    112580