مرکز منطقه ای اطلاع رساني علوم و فناوري - Session 3.1: Test generation, BIST, and memory testing

DocumentCode :

2663999

Title :

Session 3.1: Test generation, BIST, and memory testing

fYear :

2010

fDate :

14-15 Dec. 2010

Firstpage :

115

Lastpage :

116

Abstract :

Start of the above-titled section of the conference proceedings record.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Design and Test Workshop (IDT), 2010 5th International

Conference_Location :

Abu Dhabi

Print_ISBN :

978-1-61284-291-2

Electronic_ISBN :

978-1-61284-290-5

Type :

conf

DOI :

10.1109/IDT.2010.5724420

Filename :

5724420

Link To Document :