• DocumentCode
    2664051
  • Title

    MBIST architecture framework based on orthogonal constructs

  • Author

    Van de Goor, Ad J. ; Hamdioui, Said

  • Author_Institution
    ComTex, Gouda, Netherlands
  • fYear
    2010
  • fDate
    14-15 Dec. 2010
  • Firstpage
    128
  • Lastpage
    133
  • Abstract
    The observation that memory test algorithms have at most one type of complex march operation has resulted in a framework of orthogonal constructs for a novel Memory BIST (MBIST) architecture. It allows for a simple specification of a complete March Element (ME). Because all timing-critical information is available for pre-decoding prior to the application of the ME, high speed implementation is simplified considerably. A ME can specify any kind of operations, including nested operations and hammer operations, such that almost all algorithms and stresses are supported in a simple way.
  • Keywords
    built-in self test; integrated circuit testing; memory architecture; precoding; MBIST architecture; complete march element; complex march operation; hammer operation; memory BIST; memory test algorithm; nested operation; orthogonal construct; predecoding; timing-critical information; Algorithm design and analysis; Computer architecture; Delay; Engines; Microprocessors; Registers; Stress; March Element; Memory BIST; complex operation; nested operations; orthogonal constructs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2010 5th International
  • Conference_Location
    Abu Dhabi
  • Print_ISBN
    978-1-61284-291-2
  • Electronic_ISBN
    978-1-61284-290-5
  • Type

    conf

  • DOI
    10.1109/IDT.2010.5724423
  • Filename
    5724423