Title :
MBIST architecture framework based on orthogonal constructs
Author :
Van de Goor, Ad J. ; Hamdioui, Said
Author_Institution :
ComTex, Gouda, Netherlands
Abstract :
The observation that memory test algorithms have at most one type of complex march operation has resulted in a framework of orthogonal constructs for a novel Memory BIST (MBIST) architecture. It allows for a simple specification of a complete March Element (ME). Because all timing-critical information is available for pre-decoding prior to the application of the ME, high speed implementation is simplified considerably. A ME can specify any kind of operations, including nested operations and hammer operations, such that almost all algorithms and stresses are supported in a simple way.
Keywords :
built-in self test; integrated circuit testing; memory architecture; precoding; MBIST architecture; complete march element; complex march operation; hammer operation; memory BIST; memory test algorithm; nested operation; orthogonal construct; predecoding; timing-critical information; Algorithm design and analysis; Computer architecture; Delay; Engines; Microprocessors; Registers; Stress; March Element; Memory BIST; complex operation; nested operations; orthogonal constructs;
Conference_Titel :
Design and Test Workshop (IDT), 2010 5th International
Conference_Location :
Abu Dhabi
Print_ISBN :
978-1-61284-291-2
Electronic_ISBN :
978-1-61284-290-5
DOI :
10.1109/IDT.2010.5724423