Title :
Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree
Author :
Tang, Xun ; Cheng, Wu-Tung ; Guo, Ruifeng ; Tang, Huaxing ; Reddy, Sudhakar M.
Abstract :
In this work, new techniques are proposed to improve diagnosis of multiple faults based on fault-tuple equivalence tree (FTET). After carefully analyzing relations between faults in FTET, the concept of conflicts is proposed and utilized to locate the faulty sites. The proposed diagnosis algorithm can accurately identify the defect locations and also identify the physical fault types, which was demonstrated by experimental results on large ISCAS89 and ITC99 circuits.
Keywords :
fault diagnosis; network analysis; trees (mathematics); FTET; ISCAS89 circuits; ITC99 circuits; defect locations; fault-tuple equivalence tree; multiple fault diagnosis; Circuit faults; Fault location; Integrated circuit modeling; Logic gates; Object recognition; Terminology;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
DOI :
10.1109/DFT.2011.37
