Title :
A New Bulk Built-In Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies
Author :
Bastos, Rodrigo P. ; Natale, Giorgio Di ; Flottes, Marie-Lise ; Rouzeyre, Bruno
Author_Institution :
LIRMM, Univ. Montpellier II, Montpellier, France
Abstract :
Today´s deeply-scaled technology-based integrated circuits are highly sensitive to soft error, tending to be even more in the future. In fact, emerging critical issues are related to transient faults that now can be as long as circuits´ clock periods. This work presents a novel improved strategy based on bulk built-in current sensors that is able to cope with long-duration transient faults. Our cost-effective approach is a concurrent error detection scheme with recovery procedure, and rather than existing similar strategy, it has faster correction latency and uses less recovery resources.
Keywords :
error detection; fault diagnosis; integrated circuits; sensors; bulk built-in current sensor-based strategy; circuit clock periods; deep-submicron technology; integrated circuits; long-duration transient faults; Circuit faults; Clocks; Delay; Detectors; Redundancy; Registers; Transient analysis; concurrent error detection schemes; fault attacks; long-duration transient faults; soft errors;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
DOI :
10.1109/DFT.2011.15
