Title :
SoC Mixed-Signal Dependability Enhancement: A Strategy from Design to End-of-Life
Author :
Khan, Muhammad A. ; Kerkhoff, Hans G.
Author_Institution :
Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands
Abstract :
The ever shrinking technology dimensions have increased the degradation levels in integrated mixed-signal circuits mainly because of issues that were not considered in older technologies. These issues have posed new challenges and require a complete strategy starting from the design phase of the product to the end-of-life. This paper presents such a strategy starting with an early selection of dependable blocks at IP level and combines this with an efficient hardware platform architecture to address lifetime dependability issues especially for mixed-signal front ends. The proposed approach links the circuit/IP level dependability with the block level dependability enhancement and finally with the system level dependability enhancement strategy. The approach is supported by extensive simulations and provides confidence in using the proposed strategy.
Keywords :
integrated circuit design; mixed analogue-digital integrated circuits; system-on-chip; SoC mixed-signal dependability enhancement; block level dependability enhancement; circuit/IP level dependability; design phase; end-of-life; hardware platform architecture; integrated mixed-signal circuits; lifetime dependability issues; system level dependability enhancement; Analog circuits; Availability; Hardware; IP networks; Integrated circuit modeling; Integrated circuit reliability; dependability characterization; dependability recovery scheme; dependable IPs; design space exploration for dependable system; hardware redundancy; mixed-signal dependability; self-diagnosis;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
DOI :
10.1109/DFT.2011.62
