Voltage Dip Detection Based on an Efficient Least Squares Algorithm for D-STATCOM Application

Author

Manmek, Thip ; Mudannayake, Chathura P. ; Grantham, Colin

Author_Institution

Sch. of Electr. Eng. & Telecommun., New South Wales Univ., Sydney, NSW

Volume

2

fYear

2006

fDate

14-16 Aug. 2006

Firstpage

1

Lastpage

6

Abstract

This paper presents a fast voltage dip detection technique that is suitable for use in a distribution static synchronous compensator (D-STATCOM) in compensating balanced dip and unbalanced voltages in power systems. The proposed voltage dip detection method is based on an efficient least squares algorithm which offers structural simplicity and less computational complexity while maintaining dynamic performance and accuracy. It is also robust against distortions present in voltage waveforms. The proposed method extracts the active and reactive parts of the positive- and negative-sequence component for generating reference values of current that need to be injected into the point of connection D-STATCOM in order to compensate the voltage errors. The effectiveness of the voltage dip detection method in the D-STATCOM application has been verified by simulation results

Keywords

least squares approximations; power distribution faults; power supply quality; static VAr compensators; D-STATCOM; compensating balanced dip; computational complexity; distribution static synchronous compensator; dynamic performance; least squares algorithm; power system; unbalanced voltages dip; voltage dip detection technique; voltage error compensation; Automatic voltage control; Discrete Fourier transforms; Distortion measurement; Least squares methods; Phase locked loops; Power system simulation; Telecommunication control; Time measurement; Voltage control; Voltage fluctuations; Distribution Static Synchronous Compensator; least squares algorithm; voltage dip detection;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Electronics and Motion Control Conference, 2006. IPEMC 2006. CES/IEEE 5th International

Conference_Location

Shanghai

Print_ISBN

1-4244-0448-7

Type

conf

DOI

10.1109/IPEMC.2006.4778182

Filename

4778182