Title :
Online Fault Detection in Reversible Logic
Author :
Nayeem, N.M. ; Rice, J.E.
Author_Institution :
Dept. of Math & Comput. Sci., Univ. of Lethbridge, Lethbridge, AB, Canada
Abstract :
A new approach for online fault detection in Boolean reversible circuits is described. Previous work had described this approach for circuits generated by the basic ESOP-based logic synthesis, and in this work we extend the approach for any type of Toffoli networks. An online testable circuit is created by modifying an existing cascade of Toffoli gates in a simple process that involves changing the existing Toffoli gates as well as the addition of one line and 2p gates, where p is the number of lines in the original circuit.
Keywords :
circuit testing; fault diagnosis; logic circuits; Boolean reversible logic circuit; ESOP-based logic synthesis; Toffoli gate network; online fault detection; online testable circuit; Electrical fault detection; Fault tolerance; Fault tolerant systems; Logic gates; Rails; Vectors; Toffoli gates; online testability; reversible logic;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2011 IEEE International Symposium on
Conference_Location :
Vancouver, BC
Print_ISBN :
978-1-4577-1713-0
DOI :
10.1109/DFT.2011.55
