DocumentCode
2664818
Title
Exploring the Use of Local Binary Patterns as Focus Measure
Author
Lorenzo, J. ; Castrillón, M. ; Méndez, J. ; Déniz, O.
Author_Institution
Inst. of Intell. Syst. (SIANI), Univ. de Las Palmas de Gran Canaria, Las Palmas, Spain
fYear
2008
fDate
10-12 Dec. 2008
Firstpage
855
Lastpage
860
Abstract
In this work local binary patterns based focus measures are presented. Local binary patterns (LBP) have been introduced in computer vision tasks like texture classification or face recognition. In applications where recognition is based on LBP, a computational saving can be achieved with the use of LBP in the focus measures. The behavior of the proposed measures is studied to test if they fulfill the properties of the focus measures and then a comparison with some well know focus measures is carried out in different scenarios.
Keywords
computer vision; computer vision tasks; face recognition; focus measure; local binary patterns; texture classification; Application software; Computer vision; Digital cameras; Face detection; Face recognition; Focusing; Frequency; Iris; Lenses; Testing; Autofocus; Local Binary Patterns;
fLanguage
English
Publisher
ieee
Conference_Titel
Computational Intelligence for Modelling Control & Automation, 2008 International Conference on
Conference_Location
Vienna
Print_ISBN
978-0-7695-3514-2
Type
conf
DOI
10.1109/CIMCA.2008.123
Filename
5172737
Link To Document