DocumentCode
2664913
Title
Validatable nonrobust delay-fault testable circuits via logic synthesis
Author
Devadas, Srinivas ; Keutzer, Kurt
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
fYear
1990
fDate
1-3 May 1990
Firstpage
3109
Abstract
Necessary and sufficient conditions for validatable nonrobust delay-fault testability of paths in arbitrary, multilevel networks are given. Validatable nonrobust testing, as opposed to robust testing, offers degrees of freedom that enable the development of efficient synthesis procedures that target delay-fault testability, and also provides a means of producing compact test vector sets. Synthesis procedures that produce networks that are fully testable under the validatable nonrobust fault model are developed. It is shown that primality and irredundancy is both a necessary and sufficient condition for complete validatable nonrobust testability in the two-level case. It is proven that synthesizing a multilevel network using algebraic factorization retains complete validatable nonrobust testability. Preliminary experimental results, which indicate that completely validatable nonrobust testable networks can be synthesized with small area overheads using the presented synthesis procedures, are provided
Keywords
delays; logic design; logic testing; many-valued logics; algebraic factorization; compact test vector sets; delay-fault testable circuits; logic synthesis; multilevel network; validatable nonrobust testability; Circuit faults; Circuit synthesis; Circuit testing; Delay; Logic circuits; Logic testing; Network synthesis; Radio access networks; Rails; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location
New Orleans, LA
Type
conf
DOI
10.1109/ISCAS.1990.112670
Filename
112670
Link To Document