DocumentCode :
2665177
Title :
On-line estimation of key quality parameters in nonwoven production
Author :
Ressom, Habtom ; Voos, Holger ; Litz, Lothar ; Schmitt, Peter
Author_Institution :
Maine Univ., Orono, ME, USA
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1745
Abstract :
In an industrial nonwoven production process, data related to spun-web quality including firmness, thickness, and weight are measured online. However, these measurements provide insufficient information about the spun-web quality. As a result, other parameters that give a better insight into the quality of the product have been employed. One of these parameters reveals the minimum force necessary to pull apart a given size of piece of spun-web. It is measured in a quality control laboratory by stretching the ends of a sample piece of spun-web to a high degree of tension. Since the laboratory measurements are infrequent and off-line, an on-line monitoring of product quality can hardly be carried out. Neural network-based virtual sensors are developed based on historical data that incorporate both online and off-line measurements. The virtual sensors provide estimates of key quality parameters at the measurement frequency of the on-line measurements. They are implemented at a production facility of Freudenberg Nonwovens KG in Germany and have been successfully employed for on-line quality monitoring
Keywords :
computerised monitoring; neural nets; parameter estimation; production engineering computing; quality control; sensor fusion; textile industry; Freudenberg Nonwovens KG; firmness; historical data; minimum force; neural network-based virtual sensors; nonwoven production; on-line product quality monitoring; on-line quality parameter estimation; quality control laboratory; spun-web quality; stretching; tension; thickness; weight; Artificial neural networks; Frequency estimation; Frequency measurement; Intelligent sensors; Laboratories; Neural networks; Production; Quality control; Thickness measurement; Weight measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man, and Cybernetics, 2000 IEEE International Conference on
Conference_Location :
Nashville, TN
ISSN :
1062-922X
Print_ISBN :
0-7803-6583-6
Type :
conf
DOI :
10.1109/ICSMC.2000.886361
Filename :
886361
Link To Document :
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