Title :
Impulse sub-nanosecond reflectometry
Author :
Berdin, S.A. ; Karelin, S.Yu. ; Korenev, V.G. ; Magda, I.I. ; Mukhin, V.S. ; Naboka, A.M. ; Soshenko, V.A.
Author_Institution :
Inst. of Plasma Electron. & New Accel. Methods of NSC KhIPT, NASU, Kharkov, Ukraine
Abstract :
Features of impulse reflectometry using sub-nanoseconds pulses are considered. Impacts of non-uniformities in the system to the measured signal parameters are analyzed. An algorithm for observed data processing that takes into account the test signal envelope and numerous reflections originating in non-uniform system is proposed.
Keywords :
microwave reflectometry; signal processing equipment; data processing; impulse subnanosecond reflectometry; subnanoseconds pulse; test signal; Data processing; Impedance; Oscilloscopes; Reflection; Reflectometry; Transmission line measurements; Ultra wideband technology; Sub-nanosecond; impulse reflectometry; non-uniform systems; ultrawideband systems;
Conference_Titel :
Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), 2010 5th International Conference on
Conference_Location :
Sevastopol
Print_ISBN :
978-1-4244-7470-7
Electronic_ISBN :
978-1-4244-7469-1
DOI :
10.1109/UWBUSIS.2010.5609118
