DocumentCode
2665276
Title
Impulse sub-nanosecond reflectometry
Author
Berdin, S.A. ; Karelin, S.Yu. ; Korenev, V.G. ; Magda, I.I. ; Mukhin, V.S. ; Naboka, A.M. ; Soshenko, V.A.
Author_Institution
Inst. of Plasma Electron. & New Accel. Methods of NSC KhIPT, NASU, Kharkov, Ukraine
fYear
2010
fDate
6-10 Sept. 2010
Firstpage
270
Lastpage
272
Abstract
Features of impulse reflectometry using sub-nanoseconds pulses are considered. Impacts of non-uniformities in the system to the measured signal parameters are analyzed. An algorithm for observed data processing that takes into account the test signal envelope and numerous reflections originating in non-uniform system is proposed.
Keywords
microwave reflectometry; signal processing equipment; data processing; impulse subnanosecond reflectometry; subnanoseconds pulse; test signal; Data processing; Impedance; Oscilloscopes; Reflection; Reflectometry; Transmission line measurements; Ultra wideband technology; Sub-nanosecond; impulse reflectometry; non-uniform systems; ultrawideband systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), 2010 5th International Conference on
Conference_Location
Sevastopol
Print_ISBN
978-1-4244-7470-7
Electronic_ISBN
978-1-4244-7469-1
Type
conf
DOI
10.1109/UWBUSIS.2010.5609118
Filename
5609118
Link To Document