Software for processing metrological certification results of short impulse gauges

Author

Skoblikov, O.Y.

Author_Institution

Res. & Design Inst. Molniya, Nat. Tech. Univ., Kharkiv, Ukraine

fYear

2010

fDate

6-10 Sept. 2010

Firstpage

256

Lastpage

258

Abstract

“Etalon-PEMF” and “Etalon-TN” are used for metrological certification of gauges for fast processes, pulse electromagnetic fields, currents and voltages in particular. The current metrological standard GOST 8.207-2008 presupposes quite a big amount of routine calculations for the gauge certification, which makes the process very labor-intensive and increases error probability. The specialized software “Metrological statistics”, developed by the author, enables to solve this problem, extracting the data from oscilloscope images, processing all the necessary calculations and creating certification reports.

Keywords

certification; electromagnetic fields; error statistics; gauges; interferometers; signal processing; software process improvement; error probability; metrological certification results; metrological statistics; short impulse gauges; Certification; Current measurement; Graphics; Magnetic fields; Oscilloscopes; Software; Ultra wideband technology; Electromagnetic fields; data processing; gauges; metrological certification; specialized software;

fLanguage

English

Publisher

ieee

Conference_Titel

Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), 2010 5th International Conference on

Conference_Location

Sevastopol

Print_ISBN

978-1-4244-7470-7

Electronic_ISBN

978-1-4244-7469-1

Type

conf

DOI

10.1109/UWBUSIS.2010.5609122

Filename

5609122