Title :
Handling reconvergent paths using conditional probabilities in combinatorial logic netlist reliability estimation
Author :
Flaquer, Josep Torras ; Daveau, Jean-Marc ; Naviner, L. ; Roche, Philippe
Author_Institution :
STMicroelectronics, Crolles, France
Abstract :
Reliability analysis, SET and SER estimation in combinatorial logic circuits rely on various techniques ranging from SPICE simulation to probabilistic error propagation models. Signal correlations are known to be a source of error in many approaches. Such correlations are created between signals on different branches of a reconvergent path. We propose in this paper to use conditioned probabilities to handle such correlation and show that it allows achieving a correct result.
Keywords :
SPICE; circuit reliability; combinational circuits; error statistics; estimation theory; probability; SER estimation; SET estimation; SPICE simulation; combinatorial logic circuit; combinatorial logic netlist reliability estimation; conditional probability; probabilistic error propagation models; reconvergent path; signal correlation; Bismuth; Correlation; Logic gates; circuit reliability; logic design; probability; reliability estimation;
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-8155-2
DOI :
10.1109/ICECS.2010.5724504