DocumentCode :
2665394
Title :
Yield prediction of acoustic charge transport transversal filters
Author :
Kenney, J. Stevenson ; Hunt, William D. ; May, Gary S.
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1993
fDate :
4-6 Oct 1993
Firstpage :
390
Lastpage :
395
Abstract :
A yield model for gallium arsenide acoustic charge transport transversal filters is presented. It differs from previous IC yield models in that it is not assumed that individual failures of the nondestructive sensing taps necessarily cause a device failure. In this way, a redundancy in the number of taps included in the design is accounted for. Poisson statistics are used to describe the tap failures. A representative design example is presented, and the critical area for device failure is calculated. Yield is predicted for a range of defect densities, distribution functions, and redundancies. To verify the model, a Monte Carlo simulation is performed on an equivalent circuit model of the device. The results of the yield model are then compared to the Monte Carlo simulation. Better than 95% agreement is obtained for the Poisson model weighted by a triangular distribution function with one redundant circuit
Keywords :
III-V semiconductors; MESFET integrated circuits; Monte Carlo methods; Poisson distribution; acoustic charge transport devices; circuit analysis computing; equivalent circuits; failure analysis; gallium arsenide; integrated circuit modelling; integrated circuit yield; programmable filters; redundancy; surface acoustic wave delay lines; surface acoustic wave filters; GaAs; III-V semiconductor; MESFET; Monte Carlo simulation; Poisson statistics; acoustic charge transport transversal filters; critical area; defect densities; device failure; distribution functions; equivalent circuit model; nondestructive sensing taps; number of taps; programmable; redundancy; tap failures; tapped delay line; yield model; Acoustic devices; CMOS technology; Charge coupled devices; Digital signal processing; Distribution functions; Equivalent circuits; Gallium arsenide; Integrated circuit modeling; Surface acoustic waves; Transversal filters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1993, Fifteenth IEEE/CHMT International
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-1424-7
Type :
conf
DOI :
10.1109/IEMT.1993.398177
Filename :
398177
Link To Document :
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