• DocumentCode
    2665661
  • Title

    Solder bump fabrication by electroplating for flip-chip applications

  • Author

    Yu, K. Keven ; Tung, Francisca

  • fYear
    1993
  • fDate
    4-6 Oct 1993
  • Firstpage
    277
  • Lastpage
    281
  • Abstract
    A step-by-step description of a solder alloy bumping process for flip-chip application is discussed. Emphasis is placed on a 75-μm high bump, as plated, with a pitch of 125-μm array pattern is successfully achieved using conventional positive photoresist masking. The under-bump metallurgy (UBM) is sputtered Ti/Cu. The Sn/Pb composition of solder alloy such as 60/40 or 5/95 and the etchants used on the exposed UBM are discussed. This process is compatible with other IC wafer processes. The solder bump reflow is achieved utilizing a rosin flux and hot plate which is closely controlled in temperature and environment
  • Keywords
    Adhesives; Copper; Costs; Electronics packaging; Fabrication; Modems; Resists; Sputter etching; Temperature control; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1993, Fifteenth IEEE/CHMT International
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-1424-7
  • Type

    conf

  • DOI
    10.1109/IEMT.1993.398191
  • Filename
    398191