DocumentCode
2665661
Title
Solder bump fabrication by electroplating for flip-chip applications
Author
Yu, K. Keven ; Tung, Francisca
fYear
1993
fDate
4-6 Oct 1993
Firstpage
277
Lastpage
281
Abstract
A step-by-step description of a solder alloy bumping process for flip-chip application is discussed. Emphasis is placed on a 75-μm high bump, as plated, with a pitch of 125-μm array pattern is successfully achieved using conventional positive photoresist masking. The under-bump metallurgy (UBM) is sputtered Ti/Cu. The Sn/Pb composition of solder alloy such as 60/40 or 5/95 and the etchants used on the exposed UBM are discussed. This process is compatible with other IC wafer processes. The solder bump reflow is achieved utilizing a rosin flux and hot plate which is closely controlled in temperature and environment
Keywords
Adhesives; Copper; Costs; Electronics packaging; Fabrication; Modems; Resists; Sputter etching; Temperature control; Tin;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1993, Fifteenth IEEE/CHMT International
Conference_Location
Santa Clara, CA
Print_ISBN
0-7803-1424-7
Type
conf
DOI
10.1109/IEMT.1993.398191
Filename
398191
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