DocumentCode
2665706
Title
Study of Fe3+-sapphire maser above 4K
Author
Benmessai, Karim ; Mrad, Mohamad ; Creedon, Daniel Lloyd ; Floch, Jean-Michelle Le ; Tobar, Michael Edmund ; Bourgeois, Pierre-Yves ; Kersalé, Yann ; Giordano, Vincent
Author_Institution
Sch. of Phys., Univ. of Western Australia, Perth, WA, Australia
fYear
2011
fDate
2-5 May 2011
Firstpage
1
Lastpage
5
Abstract
The Whispering Gallery Mode Maser Oscillator (WHIGMO) uses paramagnetic Fe3+ ions in HEMEX sapphire at low temperature, and has been described in many previous publications [1-7]. The fractional frequency instability has been demonstrated to be as low as σy(1s<;τ<;100s) = 10-14. This instability is normally measured at the frequency-temperature turnover point of the sapphire where the effects of temperature fluctuations on frequency are nullified to first order [8-9]. Usually the temperature is determined by the relative concentrations of several paramagnetic ions such as Cr3+, Mo3+, and Ti3+. In this paper, we show that Fe3+ ions have a strong effect on the turnover point. We compare the behavior of two crystals - “Pinocchio” (concentration of active Fe3+ ions = 10ppb) and “Geppetto” (100ppb). We also report the observation of an upper limit for maser operation above 30K. This limit is explained using a Boltzmann distribution for the active ion, and we show that the populations of the energy levels are so close at this temperature that the effect of the pump at 31 GHz used to create the maser at 12 GHz is ineffective.
Keywords
Boltzmann equation; ions; iron; masers; oscillators; sapphire; Boltzmann distribution; Fe-Al2O3; HEMEX sapphire; WHIGMO; fractional frequency instability; frequency 12 GHz; frequency 31 GHz; frequency-temperature turnover point; sapphire maser; whispering gallery mode maser oscillator; Crystals; Frequency measurement; Ions; Masers; Oscillators; Resonant frequency; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location
San Fransisco, CA
ISSN
1075-6787
Print_ISBN
978-1-61284-111-3
Type
conf
DOI
10.1109/FCS.2011.5977798
Filename
5977798
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