A behavioral and temperature measurements-based modeling of an operational amplifier using VHDL-AMS

Author

Baccar, Sahbi ; Levi, Timothee ; Dallet, Dominique ; Shitikov, Vladimir ; Barbara, Franyois

Author_Institution

IMS Lab., CNRS, Talence, France

fYear

2010

fDate

12-15 Dec. 2010

Firstpage

343

Lastpage

346

Abstract

High temperature has a direct impact on the behavior of an integrated circuit (IC). Instrumentation and measurement circuits and systems are one of the most sensitive ICs to such working condition. Modeling the temperature impact on these systems could be achieved by many approaches. In this paper, we present an attractive method to characterize the temperature effect on an elementary circuit: the operational amplifier (op-amp). We develop a behavioral model for a commercial operational amplifier by using a set of temperature measurements of common performance parameters. As it presents several advantages, VHDL-AMS language was chosen to develop the model.

Keywords

hardware description languages; mixed analogue-digital integrated circuits; operational amplifiers; temperature measurement; VHDL-AMS language; analog and mixed-signal system applications; behavioral measurements-based modeling; elementary circuit; integrated circuit; op-amp; operational amplifier; temperature measurements-based modeling; Commercialization; Temperature measurement; Transconductance; Op-amp; VHDL-AMS; architecture; behavioral; high temperature; measurement; model; parameters;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on

Conference_Location

Athens

Print_ISBN

978-1-4244-8155-2

Type

conf

DOI

10.1109/ICECS.2010.5724523

Filename

5724523