Title :
A behavioral and temperature measurements-based modeling of an operational amplifier using VHDL-AMS
Author :
Baccar, Sahbi ; Levi, Timothee ; Dallet, Dominique ; Shitikov, Vladimir ; Barbara, Franyois
Author_Institution :
IMS Lab., CNRS, Talence, France
Abstract :
High temperature has a direct impact on the behavior of an integrated circuit (IC). Instrumentation and measurement circuits and systems are one of the most sensitive ICs to such working condition. Modeling the temperature impact on these systems could be achieved by many approaches. In this paper, we present an attractive method to characterize the temperature effect on an elementary circuit: the operational amplifier (op-amp). We develop a behavioral model for a commercial operational amplifier by using a set of temperature measurements of common performance parameters. As it presents several advantages, VHDL-AMS language was chosen to develop the model.
Keywords :
hardware description languages; mixed analogue-digital integrated circuits; operational amplifiers; temperature measurement; VHDL-AMS language; analog and mixed-signal system applications; behavioral measurements-based modeling; elementary circuit; integrated circuit; op-amp; operational amplifier; temperature measurements-based modeling; Commercialization; Temperature measurement; Transconductance; Op-amp; VHDL-AMS; architecture; behavioral; high temperature; measurement; model; parameters;
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-8155-2
DOI :
10.1109/ICECS.2010.5724523
