Title :
An interdigitated gate electrode field effect transistor (IGEFET) for epoxy cure monitoring
Author :
Wiseman, John M. ; Kolesar, Edward S.
Author_Institution :
US Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
Abstract :
An interdigitated gate electrode field effect transistor (IGEFET) has been fabricated and utilized to monitor the cure of a common epoxy. The IGEFET sensor consists of an interdigitated gate electrode structure coupled to the gate of a conventional MOSFET. The epoxy was deposited on the interdigitated gate electrode, and the IGEFET´s electrical performance was observed as the epoxy cured. The cross-linked chemical reaction during epoxy cure caused impedance perturbations that were quantified when the IGEFET was excited with a voltage pulse. Charge transferred through the chemically active epoxy is manifested as a time-dependent potential applied to the MOSFET gate contact. By operating the MOSFET as a linear amplifier, a potential corresponding to the time-dependent gate voltage was directly measured at the amplifier output. The Fourier transform of the IGEFET´s time-domain response at specific time increments was computed. The resulting epoxy cure spectra were compared to a common baseline formed by computing the difference spectra involving the IGEFET´s pulse excitation signal and the signal corresponding to the epoxy´s chemical state at a specific instant of time
Keywords :
chemical variables measurement; electric sensing devices; insulated gate field effect transistors; polymerisation; polymers; Fourier transform; IGEFET sensor; MOSFET gate contact; cross-linked chemical reaction; epoxy cure monitoring; epoxy cure spectra; impedance perturbations; interdigitated gate electrode field effect transistor; linear amplifier; polymers; pulse excitation signal; time-dependent gate voltage; time-dependent potential; time-domain response; voltage pulse; Chemical sensors; Contacts; Electrodes; FETs; Fourier transforms; Impedance; MOSFET circuits; Monitoring; Pulse amplifiers; Voltage measurement;
Conference_Titel :
Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
Conference_Location :
Dayton, OH
DOI :
10.1109/NAECON.1990.112739