• DocumentCode
    2666804
  • Title

    SAW-thin-film acoustoelectric in-situ observation and measurement

  • Author

    Fisher, B.H. ; Malocha, D.C.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Central Florida, Orlando, FL, USA
  • fYear
    2011
  • fDate
    2-5 May 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The thin-film acoustoelectric effect in surface acoustic wave (SAW) devices describes the interaction of electrical energy between a SAW in a piezoelectric medium and a thin-film placed in the wave´s propagation path. The real-time observation of the thin-film acoustoelectric interaction is useful in the design and characterization of SAW-based thin-film chemical and physical sensors (i.e. temperature, humidity, viscosity, voltage, current, hall effects, etc.). An in-situ test fixture was designed to be mechanically, thermally and electrically stable. Data has been taken for many SAW devices and over a wide range of frequencies. The results show that the use of the in-situ procedure yielded: good agreement between theoretical predictions and the measured data, characterization a SAW-H2 gas sensor in real-time and various methods to calibrate the film deposition system and procedure. This paper presents the approach taken in configuring an electron beam evaporation system for ultra-thin-film characterization and the design of test fixtures, data acquisition configuration, and experimental procedures to extract and analyze SAW parameters in real time, and to extract the thin-film properties under test.
  • Keywords
    calibration; gas sensors; surface acoustic wave transducers; thin film devices; SAW-based thin-film chemical sensors; SAW-gas sensor; SAW-thin-film acoustoelectric in-situ measurement; SAW-thin-film acoustoelectric in-situ observation; data acquisition configuration; electrical energy; electron beam evaporation system; in-situ test fixture; physical sensors; surface acoustic wave devices; ultrathin-film characterization; Conductivity; Films; Fixtures; Probes; Propagation losses; Substrates; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
  • Conference_Location
    San Fransisco, CA
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-61284-111-3
  • Type

    conf

  • DOI
    10.1109/FCS.2011.5977857
  • Filename
    5977857