Title :
Experimental demonstration of quantum ellipsometry
Author :
Toussaint, K.C., Jr. ; Di Giuseppe, G. ; Sergienko, A.V. ; Saleh, B.E.A. ; Teich, M.C.
Author_Institution :
Dept. of Electr. & Comput. Eng. & Phys., Boston Univ., MA, USA
Abstract :
We experimentally demonstrate the feasibility of entangled-photon quantum ellipsometry using semiconductor samples.
Keywords :
III-V semiconductors; ellipsometry; quantum entanglement; quantum optics; entangled-photon ellipsometry; quantum ellipsometry; semiconductor samples; Birefringence; Ellipsometry; Gallium arsenide; Nonlinear optics; Optical films; Optical interferometry; Optical polarization; Optical pumping; Quantum computing; Quantum entanglement;
Conference_Titel :
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-749-0
DOI :
10.1109/QELS.2003.238621
