• DocumentCode
    2666988
  • Title

    Estimating design quality of digital systems via machine learning

  • Author

    Qi Quo ; Chen, Tianshi ; Shen, Haihua ; Chen, Yunji

  • Author_Institution
    Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    12-15 Dec. 2010
  • Firstpage
    623
  • Lastpage
    626
  • Abstract
    Although the term design quality of digital systems can be assessed from many aspects, the distribution and density of bugs are two decisive factors. This paper presents the application of machine learning techniques to model the relationship between specified metrics of high-level design and its associated bug information. By employing the project repository (i.e., high level design and bug repository), the resultant models can be used to estimate the quality of associated designs, which is very beneficial for design, verification and even maintenance processes of digital systems. A real industrial microprocessor is employed to validate our approach. We hope that our work can shed some light on the application of software techniques to help improve the reliability of various digital designs.
  • Keywords
    computer debugging; digital systems; fault tolerant computing; high level synthesis; learning (artificial intelligence); software maintenance; software metrics; software quality; software reliability; systems analysis; bug repository; design quality estimation; digital system; high level design; machine learning; real industrial microprocessor; software technique; Artificial neural networks; Measurement; Training; bug repository; design quality; machine learning; software-aided;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-1-4244-8155-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2010.5724589
  • Filename
    5724589