DocumentCode :
2667079
Title :
A history of the development of CMOS oscillators: The dark horse in frequency control
Author :
McCorquodale, M.S. ; Gupta, V.
Author_Institution :
Silicon Freq. Control, Integrated Device Technol., Inc., Sunnyvale, CA, USA
fYear :
2011
fDate :
2-5 May 2011
Firstpage :
1
Lastpage :
6
Abstract :
Microelectronic technologies developed over the past decade to replace quartz crystal resonators (XTALs) and oscillators (XOs) are discussed. A new figure-of-merit (FOM) is proposed to compare these emerging technologies. It is shown that CMOS oscillators (COs) have been an underestimated technology amidst these efforts as the performance of COs is comparable to existing and emerging technologies and continues to scale. Motivations and concepts behind COs are presented along with native and package-induced frequency drift mechanisms. Design and packaging approaches that minimize drift are demonstrated. A brief history of CO product embodiments is presented. State-of-art CO performance is reported where better than ±25 ppm frequency drift is achieved over 0 to 70°C and less than 950 fsRMS phase jitter integrated from 12 kHz to 20 MHz is realized.
Keywords :
CMOS integrated circuits; crystal oscillators; frequency control; integrated circuit packaging; CMOS oscillators; figure-of-merit; frequency control; frequency drift mechanisms; microelectronic technology; packaging approach; quartz crystal oscillators; quartz crystal resonators; temperature 0 degC to 70 degC; CMOS integrated circuits; CMOS technology; Frequency control; Jitter; Micromechanical devices; Resonant frequency; Thermal stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
Conference_Location :
San Fransisco, CA
ISSN :
1075-6787
Print_ISBN :
978-1-61284-111-3
Type :
conf
DOI :
10.1109/FCS.2011.5977872
Filename :
5977872
Link To Document :
بازگشت