Development of a low noise L-band dielectric resonator oscillator

Author

Tanski, William J.

Author_Institution

United Technol. Res. Center, East Hartford, CT, USA

fYear

1994

fDate

1-3 Jun 1994

Firstpage

472

Lastpage

477

Abstract

This paper describes the design and performance of a dielectric resonator oscillator near 1.3 GHz. Unique features of this oscillator are the very low single side-band phase noise levels achieved, the effectiveness of the vibration isolation system implemented and the parabolic frequency-temperature characteristic attained. A phase noise level of -132 dBc/Hz at 1 kHz offset and a noise floor of -175 dBc/Hz were measured under both quiescent and vibrating conditions. Phase noise data are presented under sinusoidal and random vibration conditions and a vibration sensitivity of 3×10^-10/g was measured at 25 Hz vibration frequency. The temperature sensitivity was 0.4 ppm/°C at 60°C, about 7° from the measured turnaround temperature of 67°C

Keywords

dielectric resonator oscillators; electric noise measurement; electric variables measurement; microwave oscillators; phase noise; vibrations; 1 kHz; 1.3 GHz; 25 kHz; 67 C; design; low noise L-band dielectric resonator oscillator; noise floor; parabolic frequency-temperature characteristic; performance; quiescent conditions; random vibration conditions; single side-band phase noise levels; sinusoidal conditions; temperature sensitivity; vibrating conditions; vibration frequency; vibration isolation; vibration sensitivity; Dielectrics; Frequency; L-band; Noise measurement; Oscillators; Phase measurement; Phase noise; Temperature measurement; Temperature sensors; Vibration measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International

Conference_Location

Boston, MA

Print_ISBN

0-7803-1945-1

Type

conf

DOI

10.1109/FREQ.1994.398295

Filename

398295