Title :
Ceramic dielectric resonator oscillator aging
Author_Institution :
E&PS Directorate, US Army Res. Lab., Ft. Monmouth, NJ, USA
Abstract :
Two ceramic dielectric resonator oscillators (CDROs), one operating at center frequency of 1.5 GHz and the other one operating at 8.3 GHz, are being investigated for frequency aging characteristics. The oscillators were ovenized in a Sigma temperature chamber with aging temperature set at +65°C. Datas are taken with an automated test system. The frequency aging for the 1.5 GHz CDRO is found to be ±0.5 ppm/3 months and 40 ppb/hour. Aging is better than ±3 ppm/two month for the X-band CDRO. The oscillators were also evaluated for its single side band phase noise characteristic. The measured phase noise levels for the L-band oscillator were -100 dBc/Hz and -130 dBc/Hz at 100 Hz and 1 kHz carrier offset frequencies, respectively. The X-band CDRO´s phase noise levels were -66 dBc/Hz and -93 dBc/Hz, at 100 Hz and 1 kHz carrier offset frequencies, respectively
Keywords :
UHF oscillators; ageing; dielectric resonator oscillators; frequency stability; microwave oscillators; phase noise; 1.5 GHz; 65 C; 8.3 GHz; L-band oscillator; Sigma temperature chamber; X-band oscillator; automated test system; carrier offset frequency; ceramic dielectric resonator oscillator aging; frequency aging characteristics; ovenized oscillators; phase noise levels; single side band phase noise; Aging; Automatic testing; Ceramics; Dielectrics; Frequency measurement; Noise measurement; Oscillators; Phase noise; System testing; Temperature;
Conference_Titel :
Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1945-1
DOI :
10.1109/FREQ.1994.398296
