DocumentCode
2667292
Title
Towards automatic nanomanipulation at the atomic scale
Author
Knepper, T. ; Schutz, B. ; Zhang, Jianwei ; Meyer, Christian
Author_Institution
Dept. of Comput. Sci., Hamburg Univ.
fYear
0
fDate
0-0 0
Firstpage
95
Lastpage
100
Abstract
Namomanipulation using atomic force or scanning tunnelling microscopy (AFM, STM) has attracted much attention among researchers in recent years. But even on an international scale, nanomanipulation is operated mostly in manual mode. A scientist carefully carries out each individual move of the manipulator tip in order to avoid a dead-end situation. The operator has to repeat similar tasks in the same tedious and error-prone way. If nanomanipulation is to come even close to fulfilling its scientific an economic potential, the bottleneck of manual operation must be eliminated. This paper presents our activities and suggestions for automatic nanomanipulation on the atomic scale
Keywords
atomic force microscopy; micromanipulators; nanotechnology; scanning tunnelling microscopy; atomic force microscopy; atomic scale; automatic nanomanipulation; manipulator tip; scanning tunnelling microscopy; Assembly; Atomic force microscopy; Atomic measurements; Automation; Force feedback; Nanobioscience; Nanostructures; Physics; Scanning probe microscopy; User interfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Robotics and Biomimetics (ROBIO). 2005 IEEE International Conference on
Conference_Location
Shatin
Print_ISBN
0-7803-9315-5
Type
conf
DOI
10.1109/ROBIO.2005.246408
Filename
1708603
Link To Document