• DocumentCode
    2667292
  • Title

    Towards automatic nanomanipulation at the atomic scale

  • Author

    Knepper, T. ; Schutz, B. ; Zhang, Jianwei ; Meyer, Christian

  • Author_Institution
    Dept. of Comput. Sci., Hamburg Univ.
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    95
  • Lastpage
    100
  • Abstract
    Namomanipulation using atomic force or scanning tunnelling microscopy (AFM, STM) has attracted much attention among researchers in recent years. But even on an international scale, nanomanipulation is operated mostly in manual mode. A scientist carefully carries out each individual move of the manipulator tip in order to avoid a dead-end situation. The operator has to repeat similar tasks in the same tedious and error-prone way. If nanomanipulation is to come even close to fulfilling its scientific an economic potential, the bottleneck of manual operation must be eliminated. This paper presents our activities and suggestions for automatic nanomanipulation on the atomic scale
  • Keywords
    atomic force microscopy; micromanipulators; nanotechnology; scanning tunnelling microscopy; atomic force microscopy; atomic scale; automatic nanomanipulation; manipulator tip; scanning tunnelling microscopy; Assembly; Atomic force microscopy; Atomic measurements; Automation; Force feedback; Nanobioscience; Nanostructures; Physics; Scanning probe microscopy; User interfaces;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Biomimetics (ROBIO). 2005 IEEE International Conference on
  • Conference_Location
    Shatin
  • Print_ISBN
    0-7803-9315-5
  • Type

    conf

  • DOI
    10.1109/ROBIO.2005.246408
  • Filename
    1708603