• DocumentCode
    2667706
  • Title

    Voltage-controlled tuning to optimize MEMS resonator array-composite output power

  • Author

    Akgul, Mehmet ; Ren, Zeying ; Nguyen, Clark T -C

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of California, Berkeley, Berkeley, CA, USA
  • fYear
    2011
  • fDate
    2-5 May 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A voltage controlled electrical stiffness tuning method has been demonstrated to correct phase and amplitude mismatches between the constituent resonators in a half-wavelength (λ/2) mechanically coupled array-composite towards maximizing its output power. Via tuning, a nine-disk array-composite using 3 output resonators achieves an output current 2.91× larger than that of a single one of its constituent resonators, and only a bit short of the 3× theoretical maximum. Without tuning, the array-composite achieves only 2.78× the current of a single device, and the deviation from ideal is expected to increase with the number of resonators in the array. The amount of tuning available can be tailored in numerous ways, from sizing of electrode-to-disk gap spacing, to specifying the number of devices in the array involved with tuning, to simple variation of voltages across selected electrode-to-resonator gaps. By raising the power output of a high-Q micromechanical disk-array composite resonator, the method and design of this work stand to greatly lower the phase noise of oscillators referenced to such devices.
  • Keywords
    micromechanical resonators; oscillators; tuning; voltage control; MEMS resonator array-composite output power; electrode-to-disk gap spacing; high-Q micromechanical disk-array composite resonator; oscillators; voltage controlled electrical stiffness tuning method; Arrays; Couplings; Electrodes; Resonant frequency; Shape; Tuning; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
  • Conference_Location
    San Fransisco, CA
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-61284-111-3
  • Type

    conf

  • DOI
    10.1109/FCS.2011.5977901
  • Filename
    5977901