Title :
An analysis of transversely varying thickness modes in trapped energy resonators with shallow contours
Author :
Tiersten, H.F. ; Lwo, B.J. ; Dulmet, B.
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
The equation for transversely varying thickness modes in doubly-rotated quartz resonators is applied in the analysis of contoured resonators with rectangular electrodes. The influence of both the contouring and the continuity conditions at the edges of the electrodes are included in the analysis. The steady-state forced vibrations of contoured trapped energy resonators is treated and a lumped parameter representation of the admittance, which is valid in the vicinity of a resonance, is obtained. Calculated results are presented for a number of trapped energy resonators with shallow contours
Keywords :
crystal resonators; electrodes; lumped parameter networks; partial differential equations; FORCED VIBRATIONS; SiO2; continuity conditions; contoured resonators; contoured trapped energy resonators; doubly-rotated quartz resonators; equation; lumped parameter representation; rectangular electrodes; shallow contours; steady-state forced vibrations; transversely varying thickness modes; trapped energy resonators; Admittance; Differential equations; Eigenvalues and eigenfunctions; Electrodes; Performance analysis; Resonance; Resonant frequency; Steady-state;
Conference_Titel :
Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1945-1
DOI :
10.1109/FREQ.1994.398339
