DocumentCode
2668112
Title
Supply voltage glitches effects on CMOS circuits
Author
Djellid-Ouar, Anissa ; Cathebras, Guy ; Bancel, Frédéric
Author_Institution
LIRMM-UMR5506, Monlpellier
fYear
2006
fDate
5-7 Sept. 2006
Firstpage
257
Lastpage
261
Abstract
Among the attacks applied on secure circuits, fault injection techniques consist in the use of a combination of environmental conditions that induce computational errors in the chip that can leak protected informations. The purpose of our study is to build an accurate model able to describe the behaviour of CMOS circuits in presence of deliberated short supply voltage variations. This behaviour depends strongly on the basic gates (combinational logic, registers...) that make up the circuit. In this paper, we show why D-flip-flop are resistant to power supply glitches occurring between clock transitions and we propose an approach to evaluate the basic elements sensitivities towards faults generated by power glitches. Our aimed model will consequently be dependent on this sensitivity
Keywords
CMOS logic circuits; fault simulation; flip-flops; logic gates; logic testing; CMOS circuits; D-flip-flop; combinational logic; computational errors; fault injection techniques; power glitches; power supply voltage glitches; registers; secure circuits; CMOS logic circuits; Circuit faults; Clocks; Combinational circuits; Logic gates; Power supplies; Protection; Registers; Semiconductor device modeling; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on
Conference_Location
Tunis
Print_ISBN
0-7803-9726-6
Type
conf
DOI
10.1109/DTIS.2006.1708651
Filename
1708651
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