DocumentCode
2668324
Title
Fabrication And Wafer Level Testing Of Dual Stripe GMR Sensors
Author
Freitas, P.P. ; Caldeira, M.C. ; Reissner, M.
Author_Institution
INESC
fYear
1997
fDate
1-4 April 1997
Keywords
Fabrication; Hysteresis; Magnetic heads; Magnetic multilayers; Magnetic sensors; Nonhomogeneous media; Semiconductor device modeling; Sensor phenomena and characterization; Surfaces; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-3862-6
Type
conf
DOI
10.1109/INTMAG.1997.597824
Filename
597824
Link To Document