DocumentCode :
2668324
Title :
Fabrication And Wafer Level Testing Of Dual Stripe GMR Sensors
Author :
Freitas, P.P. ; Caldeira, M.C. ; Reissner, M.
Author_Institution :
INESC
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Fabrication; Hysteresis; Magnetic heads; Magnetic multilayers; Magnetic sensors; Nonhomogeneous media; Semiconductor device modeling; Sensor phenomena and characterization; Surfaces; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597824
Filename :
597824
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2668324
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