Title :
The Effect of Underlayer NIFEX on the Magnetic Propertiesof The Copt Films
Author :
Xue, S.S. ; Ryan, P.J. ; Dolejsi, J.F.
Author_Institution :
Seagate Technology
Keywords :
Argon; FCC; Magnetic films; Magnetic properties; Magnetization; Magnetometers; Semiconductor films; Soft magnetic materials; Substrates; X-ray scattering;
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
DOI :
10.1109/INTMAG.1997.597826