DocumentCode
2668462
Title
Resistance Change Due To Electromigration: Correlation To Electrical Performance
Author
HimIe, J.
Author_Institution
Maxtor Corporation
fYear
1997
fDate
1-4 April 1997
Keywords
Circuit testing; Current density; Electric resistance; Electromigration; Electrons; Heating; Land surface temperature; Magnetic heads; Pulse measurements; Space vector pulse width modulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location
New Orleans, LA, USA
Print_ISBN
0-7803-3862-6
Type
conf
DOI
10.1109/INTMAG.1997.597828
Filename
597828
Link To Document