Title :
Least-squares technique to determine the second-order nonlinearity of thin films of low symmetry
Author :
Siltanen, M. ; Cattaneo, S. ; Ylinen, L. ; Kauramen, M.
Author_Institution :
Opt. Lab., Tampere Univ. of Technol., Finland
Abstract :
We develop a least-squares technique to determine the second-harmonic susceptibility tensor of thin films of low symmetry. The technique avoids the need to calibrate absolute signal levels and allows addressing the quality of various theoretical models.
Keywords :
least squares approximations; nonlinear optical susceptibility; optical films; optical harmonic generation; thin films; Least-squares technique; second-harmonic susceptibility; second-order nonlinearity; thin films; Anisotropic magnetoresistance; Equations; Frequency; Geometrical optics; Nonlinear optical devices; Nonlinear optics; Optical films; Optical sensors; Tensile stress; Transistors;
Conference_Titel :
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-749-0
DOI :
10.1109/QELS.2003.238046
