Sinusoid detection using a sequential DFT test

We introduce a sequential test applied to the discrete Fourier transform (DFT) for detecting the presence of a sinusoid in additive Gaussian white noise. We compare the number of signal samples required for detection to that required by a single DFT detector and conclude that the sequential test is considerably more efficient when the received S/N ratio is unknown. We also show that when the same number of signal samples are required by each, the sequential test is more computationally efficient